
AO-2DSL-FCNET
Low-Oxygen Oven
- Chamber dimensions
- W1000 × D500 × H610 × 2 mm
- Temperature range
- RT (Ambient) +60 to +300°C
Semiconductor Process Ovens
Photoresist Curing Low-Oxygen Oven documented on the official DONE-E product page. Performance and configuration vary by model; the values below are included only when present in that source.
The official source page does not publish a model code. No substitute model has been invented.

Key performance
Values are shown only when they were extractable from this model's official DONE-E page.
Product overview
Photoresist Curing Low-Oxygen Oven documented on the official DONE-E product page. Performance and configuration vary by model; the values below are included only when present in that source.
Data status
Verified specifications translated from the official product page
Source verification
Official DONE-E source URLs are retained in the internal product data for factual audit.
Applications
Technical specifications
No value is borrowed from another product. Fields missing from the official page remain unpublished here.
| Temperature range | RT to 400°C, Maximum temperature:450°C |
|---|---|
| Maximum temperature | 450°C |
| Chamber quantity | 2,stacked |
| Cleanliness | Class 100 |
| Oxygen concentration | 20 ppm |
Translation and unit presentation are provided for navigation. The cited official source remains the audit reference.
Features, control & automation
Downloads
English datasheet
Coming soon — no PDF fabricated
Application guide
Coming soon — no PDF fabricated
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Engineering review